ISL71090SEH12EV1Z, ISL71090SEH25EV1Z

Radiation Hardened Ultra Low Noise, Precision Voltage Reference Evaluation Board


The ISL71090SEH12EV1Z and ISL71090SEH25EV1Z evaluation boards are designed to measure the performance of the radiation hardened ultra low noise, high precision ISL71090SEH voltage reference family. The reference has a wide input voltage range from 4V to 30V and an initial accuracy of 0.05%. Its ul tra low voltage noise (1μV P-P in the 0.1Hz to 10Hz range - ISL71090SEH12); a maximum output voltage temperature coefficient of 10ppm/°C and excellent radiation performance make the ISL71090SEH ideal for space applications.

Key Features

  • Reference output voltage:
    • 1.25V±0.05%
    • 2.5V±0.05%
  • Accuracy over temperature and radiation: ±0.15%
  • Output voltage noise:
    • 1?VP-P Typ (0.1Hz to 10Hz)
    • 2?VP-P Typ (0.1Hz to 10Hz)
  • Supply current: 930?A (Typ)
  • Tempco (box method): 10ppm/°C Max
  • Output current capability: 20mA
  • Line regulation: 8ppm/V
  • Operating temperature range: -55°C to +125°C
  • Radiation environment
    • High dose rate (50-300rad(Si)/s): 100krad(Si)
    • Low dose rate (0.01rad(Si)/s): 100krad(Si)*
    • SET/SEL/SEB: 86MeV?cm2/mg*Product capability established by initial characterization. The “EH” version is acceptance tested on a wafer by wafer basis to 50krad(Si) at low dose rate


  • RH voltage regulators precision outputs
  • Precision voltage sources for data acquisition system for space applications
  • Strain and pressure gauge for space applications

ISL71090SEH12EV1Z, ISL71090SEH25EV1Z Rad Hard Voltage Reference Eval Board

ISL71090SEH12EV1Z, ISL71090SEH25EV1Z Rad Hard Voltage Reference Eval Board


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